Researching | Microelectronics

Microelectronics

Editors-in-Chief

Xiaojun Fu

CN

CN50-1090/TN

ISSN

1004-3365

Frequency

Bimonthly issues

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Study on Application of EOTPR on Semiconductor Advanced Packaging

CHEN Xuanlong, KONG Genyong, SHI Gaoming, HE Guanghui, LIU Jiahao, LIN Xiaoling, and LI Chao

Jun. 19, 2025Microelectronics

DOI：10.13911/j.cnki.1004-3365.240094

Study on High Sensitivity and Low Offset Hall Device Based on 0.18 μm BCD Process

LI Jielin, LI Jianqiang, LI Liang, ZHOU Lin, WANG Shuangxi, and XU Yue

Jun. 19, 2025Microelectronics

DOI：10.13911/j.cnki.1004-3365.240138

Dual-channel Microwave Power Detection Chip Based on MEMS Fixed-beams

LIANG Yuxiang, LING Yutian, and WANG Debo

Jun. 19, 2025Microelectronics

DOI：10.13911/j.cnki.1004-3365.240040

A Low-capacitance Dual-directional SCR for High-speed ESD Protection

MA Chao, JIA Yirui, QI Zhao, CHEN Hongquan, WEI Jingqi, and ZHANG Bo

Jun. 19, 2025Microelectronics

DOI：10.13911/j.cnki.1004-3365.240114

A Novel Self-clamping P-shield Low Specific On-resistance SiC MOSFET

KONG Moufu, ZHAO Liang, AI Zhaoyu, CHENG Zeyu, and DENG Hongfei

Jun. 19, 2025Microelectronics

DOI：10.13911/j.cnki.1004-3365.240374

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Investigation of Single Event Transient Effects in InP-based HEMT

MicroelectronicsVol. 55, Issue 1, 21 (2025)

SEFI Characterization of High Speed JESD204B Interface Digital-to-analog Converter

MicroelectronicsVol. 55, Issue 1, 34 (2025)

Impact of Leakage Degradation Damage Caused by Heavy Ions on the Gate Reliability of SiC MOSFETs

MicroelectronicsVol. 55, Issue 1, 9 (2025)

A Novel Self-clamping P-shield Low Specific On-resistance SiC MOSFET

MicroelectronicsVol. 55, Issue 1, 140 (2025)

A NS SAR ADC with kT/C Noise Cancellation and Mismatch Error Shaping

MicroelectronicsVol. 55, Issue 1, 114 (2025)

A Radiation-hardening and Wide-input-range Bandgap Reference

MicroelectronicsVol. 55, Issue 1, 46 (2025)