Researching | Microelectronics

Microelectronics

Editors-in-Chief

Xiaojun Fu

CN

CN50-1090/TN

ISSN

1004-3365

Frequency

Bimonthly issues

Submit a Paper

Top Downloads

Investigation of Single Event Transient Effects in InP-based HEMT

MicroelectronicsVol. 55, Issue 1, 21 (2025)

SEFI Characterization of High Speed JESD204B Interface Digital-to-analog Converter

MicroelectronicsVol. 55, Issue 1, 34 (2025)

Impact of Leakage Degradation Damage Caused by Heavy Ions on the Gate Reliability of SiC MOSFETs

MicroelectronicsVol. 55, Issue 1, 9 (2025)

A Novel Self-clamping P-shield Low Specific On-resistance SiC MOSFET

MicroelectronicsVol. 55, Issue 1, 140 (2025)

A NS SAR ADC with kT/C Noise Cancellation and Mismatch Error Shaping

MicroelectronicsVol. 55, Issue 1, 114 (2025)

A Radiation-hardening and Wide-input-range Bandgap Reference

MicroelectronicsVol. 55, Issue 1, 46 (2025)