Microelectronics, Volume. 54, Issue 2, 317(2024)

Time-Domain Reconstruction of High-Speed A/D Converter

CUI Qinglin and YANG Song
Author Affiliations
  • [in Chinese]
  • show less

    High-speed A/D converters are important components in equipment, and their working environment is deteriorating with the continuous increase in device conversion clock frequency. Accurately testing the time parameters is particularly essential for comprehensively evaluating the performance of A/D converters. Currently,the time parameters for high-speed A/D converters are primarily tested by directly testing the output through an oscilloscope with a high sampling speed. In this study, the time-domain reconstruction of high-speed A/D converters is proposed. It can be used to test the time parameters of high-speed A/D converters through computer digital signal processing and avoid dependence on the sampling speed of oscilloscopes. Moreover, by studying the time-domain reconstruction of high-speed A/D converters and its application, this study verifies the correctness of the principle through experiments.

    Tools

    Get Citation

    Copy Citation Text

    CUI Qinglin, YANG Song. Time-Domain Reconstruction of High-Speed A/D Converter[J]. Microelectronics, 2024, 54(2): 317

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category:

    Received: Nov. 30, 2023

    Accepted: --

    Published Online: Aug. 21, 2024

    The Author Email:

    DOI:10.13911/j.cnki.1004-3365.230464

    Topics