Opto-Electronic Engineering
Editors-in-Chief
Xiangang Luo
CN
51-1346/O4
ISSN
1003-501X
Frequency
Monthly issues
Research on microscopic image aberration detection technology using Hartmann wavefront detectionArticle
Yifan Bu, Youyun Zou, Wenjie Du, Jie Deng, Xinlei Ge, and Jianqiang Ma
Sep. 04, 2025Opto-Electronic Engineering
DOI：10.12086/oee.2025.250089
Jinwei Liu, Huaiguang Liu, Ning Ma, and Pengfei Fu
Sep. 04, 2025Opto-Electronic Engineering
DOI：10.12086/oee.2025.250087
Zhigeng Zhang, Zhengwei Xie, Mingyang Tian, Yijia Huang, Yarong Su, Jie Zheng, and Mingjun Tang
Sep. 04, 2025Opto-Electronic Engineering
DOI：10.12086/oee.2025.250077
Shuyue Wang, Yubo Ni, Nan Gao, Zhaozong Meng, Zeqing Yang, Guofeng Zhang, Wei Yin, Hongwei Zhao, and Zonghua Zhang
Sep. 04, 2025Opto-Electronic Engineering
DOI：10.12086/oee.2025.250071
Xiaohu Wu, Jihong Zhang, and Xin Zhang
Sep. 04, 2025Opto-Electronic Engineering
DOI：10.12086/oee.2025.250069
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Research progress on on-chip integrated optical isolators
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