Opto-Electronic Engineering, Volume. 52, Issue 2, 240280-1(2025)

Improving the lightweight FCM-YOLOv8n for steel surface defect detection

Liming Liang... Kangquan Chen, Linjun Chen and Pengwei Long |Show fewer author(s)
Author Affiliations
  • School of Electrical Engineering and Automation, Jiangxi University of Science and Technology, Ganzhou, Jiangxi 341000, China
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    In response to the deficiencies of existing steel surface defect detection algorithms in terms of resource consumption, detection accuracy, and efficiency, a lightweight steel defect detection algorithm based on YOLOv8n (FCM-YOLOv8n) is proposed. First, a frequency-aware feature fusion network is utilized to efficiently extract and integrate high-frequency information, reducing computational costs while enhancing detection speed. Second, a lightweight feature interaction module (Cc-C2f) is restructured to effectively preserve spatial and channel dependencies while reducing feature redundancy, thereby lowering model parameters and computational complexity. Finally, a multi-spectrum attention mechanism is applied to mitigate feature information loss in the frequency domain, improving the accuracy of detecting complex defects. Experimental results on the Severstal and NEU-DET steel defect datasets show that, compared to YOLOv8n, the FCM-YOLOv8n algorithm achieves a 2.2% and 1.5% improvement in mAP@0.5, respectively, with a 0.5 M and 1.5 G reduction in parameters and computational complexity. The FPS reaches 143 f/s and 154 f/s, respectively, demonstrating excellent real-time performance. The algorithm achieves an optimal balance between detection accuracy, computational cost, and efficiency, providing robust support for edge device applications. Further validation on the GC10-DET dataset shows a 2.9% improvement in mAP@0.5 compared to the baseline model, fully demonstrating the algorithm's exceptional generalization ability.

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    Liming Liang, Kangquan Chen, Linjun Chen, Pengwei Long. Improving the lightweight FCM-YOLOv8n for steel surface defect detection[J]. Opto-Electronic Engineering, 2025, 52(2): 240280-1

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    Paper Information

    Category: Article

    Received: Nov. 30, 2024

    Accepted: Jan. 6, 2025

    Published Online: Apr. 27, 2025

    The Author Email:

    DOI:10.12086/oee.2025.240280

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