About Chinese Optics Letters
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Aims and Scope
Chinese Optics Letters (COL) is an international journal aimed at the rapid dissemination of latest, important discoveries and inventions in all branches of optical science and technology. The journal is sponsored by Shanghai Institute of Optics and Fine Mechanics (SIOM), Chinese Academy of Sciences and the Chinese Optical Society (COS).
Topics include, but are not limited to, fiber optics and optical communications, lasers and laser optics, Nanophotonics, nonlinear optics, biomedical optics, optical sensing, measurements, and metrology, integrated optics, materials and metamaterials, quantum optics and quantum information, ultrafast optics, plasmonics and optics at surfaces.
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Key Journal Metrics
Impact Factor: 3.3*
Google Scholar h5-index: 30†
Average Days in Peer Review: 30 days
Average Time to Publication: 90 days
*According to Optics category rankings in the 2023 Journal Citation Reports (Clarivate Analytics, 2024)
†June 2024 Google Scholar Optics & Photonics Top Publications.
Chinese Optics Letters is accessible in the CLP Researching platform and the Optica Publishing Group platform. For more information, you may email col@siom.ac.cn.
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Editorial Board
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Editor-in-Chief
Ruxin Li, ShanghaiTech University, China
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Executive Editors-in-Chief
Yanqing Lu, Nanjing University, China
Feng Chen, Shandong University, China
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Deputy Editors
Yuxin Leng, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, China
Jian Wang, Huazhong University of Science and Technology, China
Shumin Xiao, Harbin Institute of Technology (Shenzhen), China
Shifeng Zhou, South China University of Technology, China
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Topical Editors
Fang Bo, Nankai University, China
Yuping Chen, Shanghai Jiao Tong University, China
Xinyu Fan, Shanghai Jiao Tong University, China
Shaobo Fang, Institute of Physics, Chinese Academy of Sciences, China
Tian Jiang, National University of Defense Technology, China
Aleksandr Kuchmizhak, Institute of Automation and Control Processes of FEB RAS; Far Eastern Federal University, Vladivostok, Russia
Tao Li, Nanjing University, China
Jiao Lin, University of Melbourne, Australia
Zhaojun Liu, Shandong University, China
CuiCui Lu, Beijing Institute of Technology, China
Libo Ma, Leibniz Institute for Solid State and Materials Research Dresden, Germany
Xiaosong Ma, Nanjing University, China
Yufei Ma, Harbin Institute of Technology, China
Dong Mao, Northwestern Polytechnical University, China
Yujie Peng, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, China
Airán Ródenas Seguí, Universidad de La Laguna (ULL), Spain
Hua Shen, Nanjing University of Science and Technology, China
Yasuhiko Shimotsuma, Kyoto University, Japan
Zhen Tian, Tianjin University, China
Taco Visser, Shandong Normal University, China
Fan Wang, Beihang University, China
Jun Wang, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, China
Lei Wang, Jilin University, China
Shuang Wang, University of Science and Technology of China, China
Lei Wei, Nanyang Technological University , Singapore
Jian Wu, East China Normal University, China
Feihu Xu, University of Science and Technology of China, China
Jing Xu, Zhejiang University, China
Yuanjie Yang, University of Electronic Science and Technology of China, China
Xin Yuan, Westlake University, China
Jinwei Zeng, Huazhong University of Science and Technology, China
Ge Zhang, Fujian Institute of Research on the Structure of Matter, Chinese Academy of Sciences, China
Hongbo Zhang, Middle Tennessee State University, USA
Yongzhe Zhang, Beijing University of Technology, China
Chujun Zhao, Hunan University, China
Dan Zhu, Nanjing University of Aeronautics and Astronautics, China
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Early Career Editorial Board
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Wenhan Cao, Shanghai University of Science and Technology, China
Tao Chen, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, China
Peng Chen, Nanjing University, China
Zhenzhou Cheng, Tianjin University, China
Jinming Cui, University of Science and Technology of China, China
Guangwei Deng, University of Electronic Science and Technology of China, China
Fei Ding, University of South Denmark, Denmark
Ran Ding, Jilin University, China
Qingyang Du, Zhejiang Laboratory, China
Xin Guo, Zhejiang University, China
Xueshi Guo, Tianjin University, China
Jijun He, Nanjing University of Aeronautics and Astronautics, China
Sicong He, Southern University of Science and Technology, China
Chong Hou, Huazhong University of Science and Technology, China
Yidong Hou, Sichuan University, China
Shanting Hu, Beijing Institute of Technology, China
Qiushi Huang, Tongji University, China
Biqiang Jiang, Northwestern Polytechnical University, China
Hua Li, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, China
Huan Li, Zhejiang University, China
Jin Li, Beihang University, China
Fucai Liu, University of Electronic Science and Technology of China, China
Wenjun Liu, Beijing University of Posts and Telecommunications, China
Xianwen Liu, Beijing Institute of Technology, China
Junpeng Lyu, Southeast University, China
Jun Ma, Nanjing University of Science and Technology, China
Hongcheng Ni, East China Normal University, China
Junsong Peng, East China Normal University, China
Qifeng Ruan, Harbin Institute of Technology (Shenzhen), China
Zhenzhou Tang, Nanjing University of Aeronautics and Astronautics, China
Junjia Wang, Southeast University, China
Peng Wang, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, China
Yanlong Wang, Dalian Institute of Chemical Physics, Chinese Academy of Sciences, China
Dandan Wen, Northwestern Polytechnical University, China
Yipeng Wu, Shanghai Jiao Tong University, China
Ke Xu, Harbin Institute of Technology (Shenzhen), China
Jiong Yang, Soochow University, China
Yihao Yang, Zhejiang University, China
Hualei Yin, Nanjing University, China
Shaoliang Yu, Zhejiang Laboratory, China
Zejie Yu, Zhejiang University, China
Yongquan Zeng, Wuhan University, China
Junwen Zhang, Fudan University, China
Keye Zhang, East China Normal University, China
Long Zhang, Xiamen University, China
Meng Zhang, Beihang University, China
Yupeng Zhang, Shenzhen University, China
Shiyang Zhong, Institute of Physics, Chinese Academy of Sciences, China
Yu Zhou, Harbin Institute of Technology (Shenzhen), China
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Past Editorial Board Members
Contact Information
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Manuscripts Peer Review Process Inquiry:
Before consult the editor, please check the status of the submission in your Author Center
Contact:
Phone: 86-021-69918428
Email: col@siom.ac.cn
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Accounting/Invoice Inquiry:
Contact:
Phone: 86-021-69918428
E-mail: col@siom.ac.cn
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General Inquiry:
Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, 390 Qinghe Rd., Jiading, P. O. Box 800-211, 201800, Shanghai, China
E-mail: col@siom.ac.cn
Tel: 0086-21-69918428
