Researching | Characterization of the current crowding effect on chip surface using a quantum wide-field microscope

Chinese Optics Letters, Volume. 22, Issue 6, 061101(2024)

Characterization of the current crowding effect on chip surface using a quantum wide-field microscope

Rui Zhao... Ding Wang, Huan Fei Wen*, Yunbo Shi, Jun Tang** and Jun Liu*** |Show fewer author(s)

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Science and Technology on Electronic Test & Measurement Laboratory, North University of China, Taiyuan 030051, China

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Rui Zhao, Ding Wang, Huan Fei Wen, Yunbo Shi, Jun Tang, Jun Liu, "Characterization of the current crowding effect on chip surface using a quantum wide-field microscope," Chin. Opt. Lett. 22, 061101 (2024)

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Paper Information

Category: Imaging Systems and Image Processing

Received: Nov. 14, 2023

Accepted: Feb. 22, 2024

Published Online: Jun. 18, 2024

The Author Email: Huan Fei Wen (wenhuanfei@nuc.edu.cn), Jun Tang (tangjun@nuc.edu.cn), Jun Liu (liuj@nuc.edu.cn)

DOI:10.3788/COL202422.061101

CSTR:32184.14.COL202422.061101

Topics

laser devices and laser physics

Lasers and Laser Optics

laser manufacturing

Instrumentation, Measurement and Metrology