Chinese Optics Letters, Volume. 22, Issue 6, 061101(2024)
Characterization of the current crowding effect on chip surface using a quantum wide-field microscope
Fig. 2. The schematic of the microwave field reconstruction processes. (a) The grayscale map of the imaging area captured by camera; the red dash line is the outline of the DSMA. (b) Synchronous data capture depended on the frequency of the swept microwave signal. (c) The diagram of ODMR spectra of each pixel. (d) The sketch of microwave near-field distribution after pixel composition.
Fig. 3. The images of microwave field radiated by DSMA with different pump laser powers at 30 dBm microwave power.
Fig. 4. The relations between the detection microwave MF amplitude and the power of 532 nm pump laser in the location of dumbbell handle. The bottom right inset shows the relations of the pump laser power versus the calculated averages of the FWHM and the contrast of ODMR spectrum for each pixel placed in the location of the red rectangular region in the top left corner inset.
Fig. 5. Microwave near-field amplitude distribution with different microwave powers of (a) experimental and (b) simulation results.
Fig. 6. The normalized microwave MF amplitude distribution along the horizontal geometrical center of the image area. The inset presents the microwave MF amplitude distribution radiated by the DSMA with microwave power of 30 dBm and laser pump power of 0.52 W.
Fig. 7. The detection microwave amplitudes radiated by the left rectangular head, dumbbell handle, and right rectangular head regions of DSMA at different powers of the swept microwave signal.
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Rui Zhao, Ding Wang, Huan Fei Wen, Yunbo Shi, Jun Tang, Jun Liu, "Characterization of the current crowding effect on chip surface using a quantum wide-field microscope," Chin. Opt. Lett. 22, 061101 (2024)
Category: Imaging Systems and Image Processing
Received: Nov. 14, 2023
Accepted: Feb. 22, 2024
Published Online: Jun. 18, 2024
The Author Email: Huan Fei Wen (wenhuanfei@nuc.edu.cn), Jun Tang (tangjun@nuc.edu.cn), Jun Liu (liuj@nuc.edu.cn)