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Chinese Optics Letters, Volume. 22, Issue 6, 061101(2024)

Characterization of the current crowding effect on chip surface using a quantum wide-field microscope

Rui Zhao, Ding Wang, Huan Fei Wen*, Yunbo Shi, Jun Tang**, and Jun Liu***
Author Affiliations
  • Science and Technology on Electronic Test & Measurement Laboratory, North University of China, Taiyuan 030051, China
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    Article index updated: Jun. 29, 2025

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    Rui Zhao, Ding Wang, Huan Fei Wen, Yunbo Shi, Jun Tang, Jun Liu, "Characterization of the current crowding effect on chip surface using a quantum wide-field microscope," Chin. Opt. Lett. 22, 061101 (2024)

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    Paper Information

    Category: Imaging Systems and Image Processing

    Received: Nov. 14, 2023

    Accepted: Feb. 22, 2024

    Published Online: Jun. 18, 2024

    The Author Email: Huan Fei Wen (wenhuanfei@nuc.edu.cn), Jun Tang (tangjun@nuc.edu.cn), Jun Liu (liuj@nuc.edu.cn)

    DOI:10.3788/COL202422.061101

    CSTR:32184.14.COL202422.061101

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology