Laser & Optoelectronics Progress, Volume. 58, Issue 4, 0410016(2021)

Strip Defect Classification Based on Improved Generative Adversarial Networks and MobileNetV3

Jiang Chang1, Shengqi Guan1,2、*, Hongyu Shi3, Luping Hu1, and Yiqi Ni1
Author Affiliations
  • 1School of Mechanical and Electronic Engineering, Xi'an Polytechnic University, Xi'an, Shaanxi 710048, China
  • 2Shaoxing Keqiao West-Tex Textile Industry Innovative Institute, Shaoxing, Zhejiang 312030, China
  • 3School of Computer Science, Xi'an Polytechnic University, Xi'an, Shaanxi 710048, China
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    References(21)

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    Jiang Chang, Shengqi Guan, Hongyu Shi, Luping Hu, Yiqi Ni. Strip Defect Classification Based on Improved Generative Adversarial Networks and MobileNetV3[J]. Laser & Optoelectronics Progress, 2021, 58(4): 0410016

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    Paper Information

    Category: Image Processing

    Received: Jul. 6, 2020

    Accepted: Aug. 6, 2020

    Published Online: Feb. 24, 2021

    The Author Email: Guan Shengqi (sina1300841@163.com)

    DOI:10.3788/LOP202158.0410016

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