Strip Defect Classification Based on Improved Generative Adversarial Networks and MobileNetV3

Jiang Chang; Shengqi Guan; Hongyu Shi; Luping Hu; Yiqi Ni

doi:10.3788/LOP202158.0410016

Laser & Optoelectronics Progress, Volume. 58, Issue 4, 0410016(2021)

Strip Defect Classification Based on Improved Generative Adversarial Networks and MobileNetV3

Jiang Chang¹, Shengqi Guan^1,2、*, Hongyu Shi³, Luping Hu¹, and Yiqi Ni¹

Author Affiliations

¹School of Mechanical and Electronic Engineering, Xi'an Polytechnic University, Xi'an, Shaanxi 710048, China

²Shaoxing Keqiao West-Tex Textile Industry Innovative Institute, Shaoxing, Zhejiang 312030, China

³School of Computer Science, Xi'an Polytechnic University, Xi'an, Shaanxi 710048, China

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Jiang Chang, Shengqi Guan, Hongyu Shi, Luping Hu, Yiqi Ni. Strip Defect Classification Based on Improved Generative Adversarial Networks and MobileNetV3[J]. Laser & Optoelectronics Progress, 2021, 58(4): 0410016

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Paper Information

Category: Image Processing

Received: Jul. 6, 2020

Accepted: Aug. 6, 2020

Published Online: Feb. 24, 2021

The Author Email: Guan Shengqi (sina1300841@163.com)

DOI:10.3788/LOP202158.0410016

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology