Laser & Optoelectronics Progress, Volume. 58, Issue 4, 0410016(2021)
Strip Defect Classification Based on Improved Generative Adversarial Networks and MobileNetV3
Fig. 4. Images obtained by different network training. (a) 100 epochs; (b) 300 epochs; (c) 500 epochs
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Jiang Chang, Shengqi Guan, Hongyu Shi, Luping Hu, Yiqi Ni. Strip Defect Classification Based on Improved Generative Adversarial Networks and MobileNetV3[J]. Laser & Optoelectronics Progress, 2021, 58(4): 0410016
Category: Image Processing
Received: Jul. 6, 2020
Accepted: Aug. 6, 2020
Published Online: Feb. 24, 2021
The Author Email: Guan Shengqi (sina1300841@163.com)