Acta Optica Sinica, Volume. 38, Issue 9, 0912003(2018)

Depth Test of Pipeline Defects by Active Thermal Excitation and Infrared Thermography

Zhuo Wang*, Yunwei Zhang*, Yong Yu, and Yangyang Fan
Author Affiliations
  • Faculty of Information Engineering and Automation, Kunming University of Science and Technology,Kunming, Yunnan 650500, China
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    Zhuo Wang, Yunwei Zhang, Yong Yu, Yangyang Fan. Depth Test of Pipeline Defects by Active Thermal Excitation and Infrared Thermography[J]. Acta Optica Sinica, 2018, 38(9): 0912003

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Mar. 20, 2018

    Accepted: Apr. 17, 2018

    Published Online: May. 9, 2019

    The Author Email:

    DOI:10.3788/AOS201838.0912003

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