Depth Test of Pipeline Defects by Active Thermal Excitation and Infrared Thermography

Zhuo Wang; Yunwei Zhang; Yong Yu; Yangyang Fan

doi:10.3788/AOS201838.0912003

Acta Optica Sinica, Volume. 38, Issue 9, 0912003(2018)

Depth Test of Pipeline Defects by Active Thermal Excitation and Infrared Thermography

Zhuo Wang^*, Yunwei Zhang^*, Yong Yu, and Yangyang Fan

Faculty of Information Engineering and Automation, Kunming University of Science and Technology,Kunming, Yunnan 650500, China

show less

Abstract Get PDF(in Chinese)

Cited By

Article index updated: Mar. 10, 2025

The article is cited by 7 article(s) CLP online library. (Some content might be in Chinese.)

Tools

Get Citation

Copy Citation Text

Zhuo Wang, Yunwei Zhang, Yong Yu, Yangyang Fan. Depth Test of Pipeline Defects by Active Thermal Excitation and Infrared Thermography[J]. Acta Optica Sinica, 2018, 38(9): 0912003

Download Citation

EndNote(RIS)BibTex Plain Text

Set citation alerts for article

Save article for my favorites

Paper Information

Category: Instrumentation, Measurement and Metrology

Received: Mar. 20, 2018

Accepted: Apr. 17, 2018

Published Online: May. 9, 2019

The Author Email:

DOI:10.3788/AOS201838.0912003

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology