Acta Optica Sinica, Volume. 38, Issue 9, 0912003(2018)

Depth Test of Pipeline Defects by Active Thermal Excitation and Infrared Thermography

Zhuo Wang*, Yunwei Zhang*, Yong Yu, and Yangyang Fan
Author Affiliations
  • Faculty of Information Engineering and Automation, Kunming University of Science and Technology,Kunming, Yunnan 650500, China
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    Figures & Tables(14)
    (a) Excitation controller module;(b) excitation driver module; (c) resonant coil for eddy current thermal excitation; (d) eddy current excitation device in service
    Physical maps of test specimens.(a) Groove-like defects with different depths;(b) circular defects with different depths
    Variation of thermal excitation efficiency factor with resonant frequency
    Variation of thermal excitation efficiency factor with lift-off distance
    Variation of thermal excitation efficiency factor with input power
    Relationship between groove-like defect depth and average grayscale difference
    Relationship between circular defect depth and average grayscale difference
    Relationship between circular defect depth with average grayscale difference when the depth is less than 7 mm
    Infrared thermal images of verifying specimens.(a) Groove-like defect with 5 mm depth;(b) circular defect with 6 mm depth
    • Table 1. Effects of resonance frequency on thermal excitation efficiency

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      Table 1. Effects of resonance frequency on thermal excitation efficiency

      Number ofcoil turnsResonantfrequency /kHzHeat timefor 40 ℃ /sHeat timefor 60 ℃ /sTime differencefrom 40 ℃ to 60 ℃ /sε /10-5
      5416.52504852354.432
      4617.52304131835.692
      4018.52424281865.600
      3919.02214161955.342
      3820.03155322174.800
    • Table 2. Effects of lift-off distance on thermal excitation efficiency

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      Table 2. Effects of lift-off distance on thermal excitation efficiency

      Lift-offdistance /cmHeat timefor 40 ℃ /sHeat timefor 60 ℃ /sTime differencefrom 40 ℃ to 60 ℃ / sε /10-5
      1.01622891275.833
      1.51743241504.938
      2.01302971674.436
      2.51613441834.048
    • Table 3. Effects of input power on thermal excitation efficiency

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      Table 3. Effects of input power on thermal excitation efficiency

      Input powerPi /WHeat time for40 ℃ /sHeat time for60 ℃ /sTime differencefrom 40 ℃ to 60 ℃ / sε /10-5
      753305882585.168
      962114132025.157
      1441653001355.144
      1561522771255.128
      1741342471135.086
    • Table 4. Grayscale data of groove-like defects at different depths

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      Table 4. Grayscale data of groove-like defects at different depths

      Defectdepth /mmAveragegrayscale ofnon-defect areaAveragegrayscale ofdefect areaAveragegrayscaledifference
      1.027.8735.357.48
      2.027.8736.959.08
      3.029.5140.2010.69
      4.029.5144.2314.72
      4.925.2240.5415.32
      6.225.2241.7716.55
      6.825.2042.3717.17
      7.925.2044.6919.49
      9.024.7849.1724.39
    • Table 5. Grayscale data of circular defects at different depths

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      Table 5. Grayscale data of circular defects at different depths

      Defectdepth /mmAveragegrayscaleof non-defectareaAveragegrayscaleof defectareaAveragegrayscalesdifference
      1.028.6036.928.32
      2.028.6038.479.87
      3.029.1040.1011.00
      4.029.1043.7114.61
      5.028.2945.1316.84
      6.028.2948.3720.08
      7.028.3349.5821.25
      8.028.3349.921.57
      9.028.6047.6619.06
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    Zhuo Wang, Yunwei Zhang, Yong Yu, Yangyang Fan. Depth Test of Pipeline Defects by Active Thermal Excitation and Infrared Thermography[J]. Acta Optica Sinica, 2018, 38(9): 0912003

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Mar. 20, 2018

    Accepted: Apr. 17, 2018

    Published Online: May. 9, 2019

    The Author Email:

    DOI:10.3788/AOS201838.0912003

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