Journal of Infrared and Millimeter Waves, Volume. 40, Issue 2, 156(2021)

Effect of thermal annealing on the interface changes of multi-layer HgCdTe P-on-N materials grown by MBE

Chuan SHEN*, Lu CHEN, Shun-Dong BU, Yang-Rong LIU, and Li HE
Author Affiliations
  • Key Laboratory of Infrared Imaging Materials and Detectors, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China
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    Figures & Tables(9)
    Cross section of HgCdTe/CdTe/GaAs P-on-N structure
    Schematic diagram of thermal annealing under Hg pressure Note: A is HgCdTe sample, B is annealing source (Hg) , C is Quartz tube
    The changes of Cd composition under different thermal annealing conditions (a) sample A, (b) sample B
    The changes of Cd composition of CdTe/HgCdTe interface under different thermal annealing conditions (a) Sample A, (b) Sample B
    The changes of Cd composition of heterojunction interface under different thermal annealing conditions (a) sample A, (b) sample B
    The changes of As doping of heterojunction interface under different thermal annealing conditions (a) sample A, (b) sample B
    The changes of In doping under different thermal annealing conditions (a) sample A, (b) sample B
    The changes of band energy of HgCdTe P-on-N structure under different thermal annealing conditions (a) sample A, (b) sample B
    The changes of light current of HgCdTe P-on-N structure under different thermal annealing conditions (a) sample A, (b) sample B
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    Chuan SHEN, Lu CHEN, Shun-Dong BU, Yang-Rong LIU, Li HE. Effect of thermal annealing on the interface changes of multi-layer HgCdTe P-on-N materials grown by MBE[J]. Journal of Infrared and Millimeter Waves, 2021, 40(2): 156

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    Paper Information

    Category: Research Articles

    Received: May. 11, 2020

    Accepted: --

    Published Online: Aug. 31, 2021

    The Author Email: Chuan SHEN (shenchuan@mail.sitp.ac.cn)

    DOI:10.11972/j.issn.1001-9014.2021.02.003

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