Acta Optica Sinica, Volume. 44, Issue 14, 1412003(2024)

Triple Complex Phase Computer-Generated Holograms for Aspherical Surface Testing in Extreme Ultraviolet Lithography

Haitao Zhang1,2,3 and Changqing Xie1、*
Author Affiliations
  • 1State Key Lab of Fabrication Technologies for Integrated Circuits, Institute of Microelectronics of the Chinese Academy of Sciences, Beijing 100029, China
  • 2School of Integrated Circuits, University of Chinese Academy of Sciences, Beijing 100049, China
  • 3Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, Jilin , China
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    References(19)

    [14] Wang C J. Research on dual CGH using for absolute test of aspherics[D](2008).

    [16] Feng J. Highly accuracy aspheric surface testing based on computer-generated hologram[D](2014).

    [19] Wang L P, Zhang H T. Aspherical null testing system for extreme ultraviolet lithography mirrors[J]. Chinese Journal of Lasers, 39, s208002(2012).

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    Haitao Zhang, Changqing Xie. Triple Complex Phase Computer-Generated Holograms for Aspherical Surface Testing in Extreme Ultraviolet Lithography[J]. Acta Optica Sinica, 2024, 44(14): 1412003

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Jan. 10, 2024

    Accepted: Mar. 28, 2024

    Published Online: Jul. 4, 2024

    The Author Email: Xie Changqing (xiechangqing@ime.ac.cn)

    DOI:10.3788/AOS240476

    CSTR:32393.14.AOS240476

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