Acta Optica Sinica, Volume. 44, Issue 14, 1412003(2024)

Triple Complex Phase Computer-Generated Holograms for Aspherical Surface Testing in Extreme Ultraviolet Lithography

Haitao Zhang1,2,3 and Changqing Xie1、*
Author Affiliations
  • 1State Key Lab of Fabrication Technologies for Integrated Circuits, Institute of Microelectronics of the Chinese Academy of Sciences, Beijing 100029, China
  • 2School of Integrated Circuits, University of Chinese Academy of Sciences, Beijing 100049, China
  • 3Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, Jilin , China
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    Figures & Tables(9)
    Principle of aspherical surface measurement by CGH
    Schematic of pattern position error
    Schematic of diffraction wavefronts for multiple structure CGH emitting three wavefronts simultaneously
    Equivalent linewidth of CGH diffraction aspherical wavefront along different directions. (a) X direction; (b) Y direction
    Photo of aspherical surface test equipment
    Distribution of surface form for different standard lenses. (a) TF standard lens; (b) RF standard lens
    Distribution of surface form of six tests. (a) Test 2; (b) test 3; (c) test 4; (d) test 5; (e) test 6
    Aspherical surface form distribution calculated with triple complex phase CGH by removing systematic errors
    Aspherical surface form distribution based on refraction null compensation
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    Haitao Zhang, Changqing Xie. Triple Complex Phase Computer-Generated Holograms for Aspherical Surface Testing in Extreme Ultraviolet Lithography[J]. Acta Optica Sinica, 2024, 44(14): 1412003

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Jan. 10, 2024

    Accepted: Mar. 28, 2024

    Published Online: Jul. 4, 2024

    The Author Email: Xie Changqing (xiechangqing@ime.ac.cn)

    DOI:10.3788/AOS240476

    CSTR:32393.14.AOS240476

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