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Chinese Optics Letters, Volume. 20, Issue 6, 062501(2022)

Germanium-on-silicon avalanche photodiode for 1550 nm weak light signal detection at room temperature

Yuxuan Li1, Xiaobin Liu1, Xuetong Li1, Lanxuan Zhang1, Baisong Chen1, Zihao Zhi1, Xueyan Li1, Guowei Zhang2,3, Peng Ye2,3, Guanzhong Huang2,3, Deyong He2,3, Wei Chen2,3, Fengli Gao1, Pengfei Guo4, Xianshu Luo4, Guoqiang Lo4, and Junfeng Song1,5、*
Author Affiliations
  • 1State Key Laboratory of Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, Changchun 130012, China
  • 2CAS Key Laboratory of Quantum Information, University of Science and Technology of China, Hefei 230026, China
  • 3CAS Center for Excellence in Quantum Information and Quantum Physics, University of Science and Technology of China, Hefei 230026, China
  • 4Advanced Micro Foundry Pte Ltd., Singapore 117685, Singapore
  • 5Peng Cheng Laboratory, Shenzhen 518000, China
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    Article index updated: Dec. 10, 2024

    Citation counts are provided from Web of Science. The counts may vary by service, and are reliant on the availability of their data.
    The article is cited by 6 article(s) from Web of Science.
    The article is cited by 2 article(s) CLP online library. (Some content might be in Chinese.)
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    Yuxuan Li, Xiaobin Liu, Xuetong Li, Lanxuan Zhang, Baisong Chen, Zihao Zhi, Xueyan Li, Guowei Zhang, Peng Ye, Guanzhong Huang, Deyong He, Wei Chen, Fengli Gao, Pengfei Guo, Xianshu Luo, Guoqiang Lo, Junfeng Song, "Germanium-on-silicon avalanche photodiode for 1550 nm weak light signal detection at room temperature," Chin. Opt. Lett. 20, 062501 (2022)

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    Paper Information

    Category: Optoelectronics

    Received: Dec. 30, 2021

    Accepted: Mar. 22, 2022

    Posted: Apr. 27, 2022

    Published Online: Apr. 29, 2022

    The Author Email: Junfeng Song (songjf@jlu.edu.cn)

    DOI:10.3788/COL202220.062501

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology