Acta Optica Sinica, Volume. 40, Issue 7, 0711003(2020)

A Dark-Field Detection Algorithm to Detect Surface Contamination in Large-Aperture Reflectors

Zhaoyang Yin1, Dezhi Zhang1, Linjie Zhao1,2, Mingjun Chen1、*, Jian Cheng1、**, Xiaodong Jiang2, Xinxiang Miao2, and Longfei Niu2
Author Affiliations
  • 1School of Mechatronics Engineering, Harbin Institute of Technology, Harbin, Heilongjiang 150001, China
  • 2Research Center of Laser Fusion, China Academy of Engineering Physics, Mianyang, Sichuan 621900, China
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    Zhaoyang Yin, Dezhi Zhang, Linjie Zhao, Mingjun Chen, Jian Cheng, Xiaodong Jiang, Xinxiang Miao, Longfei Niu. A Dark-Field Detection Algorithm to Detect Surface Contamination in Large-Aperture Reflectors[J]. Acta Optica Sinica, 2020, 40(7): 0711003

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    Paper Information

    Category: Imaging Systems

    Received: Sep. 2, 2019

    Accepted: Dec. 12, 2019

    Published Online: Apr. 15, 2020

    The Author Email: Chen Mingjun (chenmj@hit.edu.cn), Cheng Jian (cheng.826@hit.edu.cn)

    DOI:10.3788/AOS202040.0711003

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