Acta Optica Sinica, Volume. 40, Issue 7, 0711003(2020)
A Dark-Field Detection Algorithm to Detect Surface Contamination in Large-Aperture Reflectors
Fig. 7. Comparison before and after top hat transformation. (a) Grayscale map of original image; (b) grayscale map of transformation results
Fig. 8. Autofocus curve. (a) Tenengrad function curve of coarse adjustment; (b) focusing motor position curve of accurate adjustment; (c) sub-window Tenengrad function curve of accurate adjustment
Fig. 9. Image contrast before and after autofocusing. (a) Image before autofocusing; (b) image after autofocusing
Fig. 10. Binarization algorithm comparison. (a) Original image; (b) Otsu algorithm; (c) maximum entropy model; (d) mean weighted adaptive binarization algorithm; (e) Laplacian weighted adaptive binarization algorithm
Fig. 11. Results of ultra-depth microscope. (a) Microscopic image of area 1; (b) microscopic image of area 2
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Zhaoyang Yin, Dezhi Zhang, Linjie Zhao, Mingjun Chen, Jian Cheng, Xiaodong Jiang, Xinxiang Miao, Longfei Niu. A Dark-Field Detection Algorithm to Detect Surface Contamination in Large-Aperture Reflectors[J]. Acta Optica Sinica, 2020, 40(7): 0711003
Category: Imaging Systems
Received: Sep. 2, 2019
Accepted: Dec. 12, 2019
Published Online: Apr. 15, 2020
The Author Email: Chen Mingjun (chenmj@hit.edu.cn), Cheng Jian (cheng.826@hit.edu.cn)