Chinese Journal of Lasers, Volume. 44, Issue 1, 103001(2017)

Identifying Defects in Thin Film of High Power Laser Lens by Using Near Field Microimaging Method

Bai Zhongchen1、*, Huang Zhaoling1, Hao Licai2, Lu Anjiang2, and Qin Shuijie1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    References(24)

    [1] Zheng Wanguo[M]. Damage resistance and physical problems of high power laser facilties(2014).

    [2] Wang H, Hsieh S J, Singh B. Detection of pinhole defects in optical film using thermography and artificial neural network[C]. SPIE, 9485, 94850J(2015).

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    [8] Tang Jinfa[M]. Modern optical thin film technology(2006).

    [15] Johnson L F, Ashley E J, Donovan T M et al. Scanning electron microscopy studies of laser damage initiating defects in ZnSe/ThF4 and SiH/SiO2 multilayer coatings. [C]//1985 Los Angeles Technical Symposium. International Society for Optics and Photonics, 127-139(1985).

    [16] Sawicki R H, Shang C C, Swatloski T L. Failure characterization of nodular defects in multilayer dielectric coatings. [C]//Laser-Induced Damage in Optical Materials: 1994. International Society for Optics and Photonics, 333-343(1995).

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    Bai Zhongchen, Huang Zhaoling, Hao Licai, Lu Anjiang, Qin Shuijie. Identifying Defects in Thin Film of High Power Laser Lens by Using Near Field Microimaging Method[J]. Chinese Journal of Lasers, 2017, 44(1): 103001

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    Paper Information

    Category: materials and thin films

    Received: Sep. 29, 2016

    Accepted: --

    Published Online: Jan. 10, 2017

    The Author Email: Zhongchen Bai (yufengvc@163.com)

    DOI:10.3788/CJL201744.0103001

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