Chinese Journal of Lasers, Volume. 44, Issue 1, 103001(2017)

Identifying Defects in Thin Film of High Power Laser Lens by Using Near Field Microimaging Method

Bai Zhongchen1、*, Huang Zhaoling1, Hao Licai2, Lu Anjiang2, and Qin Shuijie1
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    Bai Zhongchen, Huang Zhaoling, Hao Licai, Lu Anjiang, Qin Shuijie. Identifying Defects in Thin Film of High Power Laser Lens by Using Near Field Microimaging Method[J]. Chinese Journal of Lasers, 2017, 44(1): 103001

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    Paper Information

    Category: materials and thin films

    Received: Sep. 29, 2016

    Accepted: --

    Published Online: Jan. 10, 2017

    The Author Email: Zhongchen Bai (yufengvc@163.com)

    DOI:10.3788/CJL201744.0103001

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