Chinese Journal of Lasers, Volume. 44, Issue 1, 103001(2017)
Identifying Defects in Thin Film of High Power Laser Lens by Using Near Field Microimaging Method
Article index updated: Mar. 10, 2025
Get Citation
Copy Citation Text
Bai Zhongchen, Huang Zhaoling, Hao Licai, Lu Anjiang, Qin Shuijie. Identifying Defects in Thin Film of High Power Laser Lens by Using Near Field Microimaging Method[J]. Chinese Journal of Lasers, 2017, 44(1): 103001
Category: materials and thin films
Received: Sep. 29, 2016
Accepted: --
Published Online: Jan. 10, 2017
The Author Email: Zhongchen Bai (yufengvc@163.com)