Acta Optica Sinica, Volume. 44, Issue 13, 1334002(2024)
X-Ray Nano-Resolution Stereo Imaging and Its Application in Chip Characterization
Fig. 2. Schematic diagram of two X-ray beams recording two projections of the same object
Fig. 3. Schematic diagram of coordinate system for obtaining sample depth information from X-ray stereo image
Fig. 5. Simulated spiral images. (a) Initial acquisition projection; (b) acquisition projection after rotating θ; (c) top view
Fig. 8. Resolution target images. (a)
Fig. 9. Resolution target reconstruction results. (a) Depth map; (b) 3D view; (c) SEM image
Fig. 10. Chip images. (a) Chip samples under optical microscope; (b)
Fig. 11. Chip sample reconstruction results. (a) Parallax map; (b) depth map; (c) 3D view
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Cong Liu, Feixiang Wang, Fen Tao, Guohao Du, Ling Zhang, Jun Wang, Biao Deng. X-Ray Nano-Resolution Stereo Imaging and Its Application in Chip Characterization[J]. Acta Optica Sinica, 2024, 44(13): 1334002
Category: X-Ray Optics
Received: Jan. 26, 2024
Accepted: Mar. 18, 2024
Published Online: Jul. 4, 2024
The Author Email: Wang Feixiang (wangfx@sari.ac.cn), Deng Biao (dengb@sari.ac.cn)
CSTR:32393.14.AOS240575