Acta Optica Sinica, Volume. 44, Issue 13, 1334002(2024)

X-Ray Nano-Resolution Stereo Imaging and Its Application in Chip Characterization

Cong Liu1,2, Feixiang Wang2、*, Fen Tao2, Guohao Du2, Ling Zhang2, Jun Wang2, and Biao Deng2、**
Author Affiliations
  • 1School of Microelectronics, Shanghai University, Shanghai 200444, China
  • 2Shanghai Synchrotron Radiation Facility, Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201204, China
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    Figures & Tables(12)
    Schematic diagram of nano tree-dimensional (3D) imaging system
    Schematic diagram of two X-ray beams recording two projections of the same object
    Schematic diagram of coordinate system for obtaining sample depth information from X-ray stereo image
    Flow chart of stereo reconstruction algorithm
    Simulated spiral images. (a) Initial acquisition projection; (b) acquisition projection after rotating θ; (c) top view
    Depth image obtained by NCC algorithm
    Comparison between depth obtained by NCC algorithm and real depth
    Resolution target images. (a) -10° projection image; (b) +10° projection image; (c) parallax map
    Resolution target reconstruction results. (a) Depth map; (b) 3D view; (c) SEM image
    Chip images. (a) Chip samples under optical microscope; (b) -10° projection image; (c) +10° projection image
    Chip sample reconstruction results. (a) Parallax map; (b) depth map; (c) 3D view
    • Table 1. Resolution target depth recovery data analysis based on NCC algorithm

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      Table 1. Resolution target depth recovery data analysis based on NCC algorithm

      Projection angle difference /(°)Standard pixel pointRecovered pixel pointRecovery rate /%Squared difference from standard parallax /10-4
      16470133595076.468.13
      18468753558675.918.01
      20471303734279.238.11
      22472383736479.098.31
      24474753720778.378.20
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    Cong Liu, Feixiang Wang, Fen Tao, Guohao Du, Ling Zhang, Jun Wang, Biao Deng. X-Ray Nano-Resolution Stereo Imaging and Its Application in Chip Characterization[J]. Acta Optica Sinica, 2024, 44(13): 1334002

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    Paper Information

    Category: X-Ray Optics

    Received: Jan. 26, 2024

    Accepted: Mar. 18, 2024

    Published Online: Jul. 4, 2024

    The Author Email: Wang Feixiang (wangfx@sari.ac.cn), Deng Biao (dengb@sari.ac.cn)

    DOI:10.3788/AOS240575

    CSTR:32393.14.AOS240575

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