Chinese Journal of Lasers, Volume. 46, Issue 6, 0614004(2019)
Photoelectric Characterization Technique Based on Terahertz Semiconductor Quantum-Well Devices and Its Applications
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Zhiyong Tan, Juncheng Cao. Photoelectric Characterization Technique Based on Terahertz Semiconductor Quantum-Well Devices and Its Applications[J]. Chinese Journal of Lasers, 2019, 46(6): 0614004
Category: terahertz technology
Received: Mar. 27, 2019
Accepted: Apr. 28, 2019
Published Online: Jun. 14, 2019
The Author Email: Cao Juncheng (jccao@mail.sim.ac.cn)