Chinese Optics Letters, Volume. 22, Issue 11, 112501(2024)

Ultraviolet spot position measurement based on 4 H-SiC quadrant photodetectors

Peichen Yang1, Yifu Wang1, Weizong Xu1,2、*, Dong Zhou1, Fangfang Ren1,2, Dunjun Chen1, Rong Zhang1,2, Youliao Zheng1, and Hai Lu1,2、**
Author Affiliations
  • 1School of Electronic Science and Engineering, Nanjing University, Nanjing 210023, China
  • 2Hefei National Laboratory, Hefei 230088, China
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    References(30)

    [18] J. Romijn, S. Vollebregt, A. May et al. Visible blind quadrant sun position sensor in a silicon carbide technology. IEEE 35th International Conference on Micro Electro Mechanical Systems Conference (MEMS), 535(2022).

    [23] P. M. Licla, E. Laura Bravo, G. Kemper et al. A method of irradiance distributing over an effective irradiated area for phototherapy lamps. IEEE 25th International Conference on Electronics, Electrical Engineering and Computing (INTERCON), 1(2018).

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    Peichen Yang, Yifu Wang, Weizong Xu, Dong Zhou, Fangfang Ren, Dunjun Chen, Rong Zhang, Youliao Zheng, Hai Lu, "Ultraviolet spot position measurement based on 4 H-SiC quadrant photodetectors," Chin. Opt. Lett. 22, 112501 (2024)

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    Paper Information

    Category: Optoelectronics

    Received: Mar. 25, 2024

    Accepted: Jun. 2, 2024

    Published Online: Nov. 26, 2024

    The Author Email: Weizong Xu (wz.xu@nju.edu.cn), Hai Lu (hailu@nju.edu.cn)

    DOI:10.3788/COL202422.112501

    CSTR:32184.14.COL202422.112501

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