Ultraviolet spot position measurement based on 4 H-SiC quadrant photodetectors

Peichen Yang; Yifu Wang; Weizong Xu; Dong Zhou; Fangfang Ren; Dunjun Chen; Rong Zhang; Youliao Zheng; Hai Lu

doi:10.3788/COL202422.112501

Chinese Optics Letters, Volume. 22, Issue 11, 112501(2024)

Ultraviolet spot position measurement based on 4 H-SiC quadrant photodetectors

Peichen Yang1... Yifu Wang1, Weizong Xu1,2,*, Dong Zhou1, Fangfang Ren1,2, Dunjun Chen1, Rong Zhang1,2, Youliao Zheng1, and Hai Lu12,** |Show fewer author(s)

Author Affiliations

¹School of Electronic Science and Engineering, Nanjing University, Nanjing 210023, China

²Hefei National Laboratory, Hefei 230088, China

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Peichen Yang, Yifu Wang, Weizong Xu, Dong Zhou, Fangfang Ren, Dunjun Chen, Rong Zhang, Youliao Zheng, Hai Lu, "Ultraviolet spot position measurement based on 4 H-SiC quadrant photodetectors," Chin. Opt. Lett. 22, 112501 (2024)

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