Chinese Journal of Lasers, Volume. 48, Issue 17, 1705003(2021)
Single Exposure Beam Quality Analysis Technique with Binary Amplitude Modulation
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Siyuan He, Xingchen Pan, Cheng Liu, Jianqiang Zhu. Single Exposure Beam Quality Analysis Technique with Binary Amplitude Modulation[J]. Chinese Journal of Lasers, 2021, 48(17): 1705003
Category: Beam transmission and control
Received: Feb. 2, 2021
Accepted: Mar. 9, 2021
Published Online: Sep. 1, 2021
The Author Email: Pan Xingchen (xchpan@siom.ac.cn)