Single Exposure Beam Quality Analysis Technique with Binary Amplitude Modulation

Siyuan He; Xingchen Pan; Cheng Liu; Jianqiang Zhu

doi:10.3788/CJL202148.1705003

Chinese Journal of Lasers, Volume. 48, Issue 17, 1705003(2021)

Single Exposure Beam Quality Analysis Technique with Binary Amplitude Modulation

Siyuan He^1,2,3, Xingchen Pan^1,2、*, Cheng Liu^1,2, and Jianqiang Zhu^1,2

¹Key Laboratory of High Power Laser and Physics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China

²National Laboratory on High Power Laser and Physics, China Academy of Engineering Physics, Chinese Academy of Sciences, Shanghai 201800, China

³University of Chinese Academy of Sciences, Beijing 100049, China

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Siyuan He, Xingchen Pan, Cheng Liu, Jianqiang Zhu. Single Exposure Beam Quality Analysis Technique with Binary Amplitude Modulation[J]. Chinese Journal of Lasers, 2021, 48(17): 1705003

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Paper Information

Category: Beam transmission and control

Received: Feb. 2, 2021

Accepted: Mar. 9, 2021

Published Online: Sep. 1, 2021

The Author Email: Xingchen Pan (xchpan@siom.ac.cn)

DOI:10.3788/CJL202148.1705003

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology