Acta Optica Sinica, Volume. 37, Issue 12, 1231001(2017)

Optical and Mechanical Properties and Microstructures of Nb2O5, Ta2O5 and SiO2 Thin Films Prepared by Ion Beam Sputtering

Wenjia Yuan, Weidong Shen*, Xiaowen Zheng, Chenying Yang, Yueguang Zhang, Bo Fang, Wen Mu, Chaonan Chen, and Xu Liu
Author Affiliations
  • State Key Laboratory of Modern Optical Instrumentation, College of Optical Science and Engineering, Zhejiang University, Hangzhou, Zhejiang 310027, China
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    Figures & Tables(10)
    Structural diagram of DIBS system
    Transmission curves of Ta2O5 films prepared under different assisted ion source voltages
    Optical constants of different thin films prepared by different methods of EBE, IBAD and IBS when wavelength is 550 nm.(a) Nb2O5; (b) Ta2O5; (c) SiO2
    Stress value of different thin films prepared by three deposition methods of EBE, IBAD and IBS.(a) Nb2O5; (b) Ta2O5; (c) SiO2
    Hardness of different thin films prepared by three deposition methods of EBE, IBAD and IBS.(a) Nb2O5; (b) Ta2O5; (c) SiO2
    Young modulus of different thin films prepared by three deposition methods of EBE, IBAD and IBS.(a) Nb2O5; (b) Ta2O5; (c) SiO2
    Surface morphologies of Ta2O5 thin films prepared by (a) EBE, (b) IBAD, (c) SIBS and (d) DIBS
    Cross-sectional morphologies of Ta2O5 thin films prepared by (a) EBE, (b) IBAD and (c) DIBS
    • Table 1. Process parameters of IBS deposition

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      Table 1. Process parameters of IBS deposition

      MaterialSputtering ion source parameterAssisted ion source parameterBackground pressure /(10-4 Pa)Working pressure /(10-2 Pa)
      Beam current /mABeam voltage /VGas flow /(mL·min-1)Beam current /mABeam voltage /VGas flow /(mL·min-1)
      Nb2O5400100016(Ar)100200-8006(Ar), 18(O2)1.05.0
      Ta2O5400100016(Ar)100200-6006(Ar), 18(O2)1.05.0
      SiO2400100016(Ar)100200-6006(Ar), 18(O2)1.05.1
    • Table 2. Process parameters of EBE and IBAD

      View table

      Table 2. Process parameters of EBE and IBAD

      MaterialTemperature /℃Working pressure /(10-2 Pa)Deposition rate /(nm·s-1)
      EBEIBADEBEIBADEBEIBAD
      Nb2O52302002.02.00.30.3
      Ta2O52302002.02.00.30.3
      SiO22302000.31.30.80.8
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    Wenjia Yuan, Weidong Shen, Xiaowen Zheng, Chenying Yang, Yueguang Zhang, Bo Fang, Wen Mu, Chaonan Chen, Xu Liu. Optical and Mechanical Properties and Microstructures of Nb2O5, Ta2O5 and SiO2 Thin Films Prepared by Ion Beam Sputtering[J]. Acta Optica Sinica, 2017, 37(12): 1231001

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    Paper Information

    Category: Thin Films

    Received: Jul. 3, 2017

    Accepted: --

    Published Online: Sep. 6, 2018

    The Author Email: Shen Weidong (adongszju@hotmail.com)

    DOI:10.3788/AOS201737.1231001

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