Laser & Optoelectronics Progress, Volume. 55, Issue 11, 111005(2018)
No-Reference Quality Assessment Method of Evaluating Scanning Electron Microscopy Images Based on Multi-Scale Characteristics
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Qiaoyue Li, Gangcheng Shang, Qiang Tian, Xi Chen, Xixi Han, Yu Zhou, Leida Li. No-Reference Quality Assessment Method of Evaluating Scanning Electron Microscopy Images Based on Multi-Scale Characteristics[J]. Laser & Optoelectronics Progress, 2018, 55(11): 111005
Category: Image Processing
Received: Apr. 16, 2018
Accepted: May. 28, 2018
Published Online: Aug. 14, 2019
The Author Email: Qiaoyue Li (lqy.com.cn@163.com)