No-Reference Quality Assessment Method of Evaluating Scanning Electron Microscopy Images Based on Multi-Scale Characteristics

Qiaoyue Li; Gangcheng Shang; Qiang Tian; Xi Chen; Xixi Han; Yu Zhou; Leida Li

doi:10.3788/LOP55.111005

Laser & Optoelectronics Progress, Volume. 55, Issue 11, 111005(2018)

No-Reference Quality Assessment Method of Evaluating Scanning Electron Microscopy Images Based on Multi-Scale Characteristics

Qiaoyue Li^1、*, Gangcheng Shang², Qiang Tian³, Xi Chen¹, Xixi Han¹, Yu Zhou¹, and Leida Li¹

Author Affiliations

¹ School of Information and Control Engineering, China University of Mining and Technology, Xuzhou, Jiangsu 221116, China

² Communication and Information Center, State Administration of Work Safety, Beijing 100013, China

³ Automatic Mine Office, Shanxi Lu'An Environmental Energy Development Co., Ltd., Changzhi, Shanxi 0 46102, China

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Qiaoyue Li, Gangcheng Shang, Qiang Tian, Xi Chen, Xixi Han, Yu Zhou, Leida Li. No-Reference Quality Assessment Method of Evaluating Scanning Electron Microscopy Images Based on Multi-Scale Characteristics[J]. Laser & Optoelectronics Progress, 2018, 55(11): 111005

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Paper Information

Category: Image Processing

Received: Apr. 16, 2018

Accepted: May. 28, 2018

Published Online: Aug. 14, 2019

The Author Email: Qiaoyue Li (lqy.com.cn@163.com)

DOI:10.3788/LOP55.111005

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology