No-Reference Quality Assessment Method of Evaluating Scanning Electron Microscopy Images Based on Multi-Scale Characteristics

Qiaoyue Li; Gangcheng Shang; Qiang Tian; Xi Chen; Xixi Han; Yu Zhou; Leida Li

doi:10.3788/LOP55.111005

Laser & Optoelectronics Progress, Volume. 55, Issue 11, 111005(2018)

No-Reference Quality Assessment Method of Evaluating Scanning Electron Microscopy Images Based on Multi-Scale Characteristics

Qiaoyue Li^1、*, Gangcheng Shang², Qiang Tian³, Xi Chen¹, Xixi Han¹, Yu Zhou¹, and Leida Li¹

Author Affiliations

¹ School of Information and Control Engineering, China University of Mining and Technology, Xuzhou, Jiangsu 221116, China

² Communication and Information Center, State Administration of Work Safety, Beijing 100013, China

³ Automatic Mine Office, Shanxi Lu'An Environmental Energy Development Co., Ltd., Changzhi, Shanxi 0 46102, China

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Figures & Tables(6)

Fig. 1. Illustration of interactive system used in subjective viewing experiments

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Fig. 2. (a) Clear SEM images and (b)(c) corresponding contrast distortion images

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Fig. 3. Flow chart of proposed method

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Fig. 4. F statistics of the other metrics against the proposed method

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Table 1. Results of mainstream quality assessment methods and proposed method tested in the SEM database

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Table 1. Results of mainstream quality assessment methods and proposed method tested in the SEM database

Algorithm		PLCC	SRCC	RMSE
FR	MS-SSIM	0.6116	0.6017	0.6846
	PSNR	0.5914	0.5587	0.5839
	GMSD	0.5877	0.5561	0.5859
	SSIM	0.5618	0.5409	0.5222
	FSIM	0.4793	0.4532	0.6355
	PCQI	0.4721	0.4462	0.6792
NR	CORNIA	0.8199	0.7933	0.3996
	DESIQUE	0.7621	0.7309	0.4510
	BRISQUE	0.7299	0.7038	0.4761
	Bliinds2	0.7216	0.6965	0.4786
	BIQI	0.6462	0.6301	0.5356
	DIIVINE	0.5854	0.5608	0.5611
	SSEQ	0.5789	0.5464	0.5672
	NSS	0.4864	0.4772	0.6170
	QAC	0.4251	0.4300	0.6554
	NIQE	0.3518	0.4234	0.6782
FOR CD	NR-CDIQA	0.4864	0.4772	0.6170
Proposed		0.8504	0.8211	0.3733

Table 2. Statistical performance results of compared metrics against the proposed method
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Table 2. Statistical performance results of compared metrics against the proposed method
Metric MS-SSIM PSNR GMSD SSIM FSIM PCQI NR-CDIQA CORNIA
1 1 1 1 1 1 1 0
Metric DESIQUE BRISQUE BLLINDS-II BIQI DIIVINE SSEQ QAC NIQE
1 1 1 1 1 1 1 1

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Qiaoyue Li, Gangcheng Shang, Qiang Tian, Xi Chen, Xixi Han, Yu Zhou, Leida Li. No-Reference Quality Assessment Method of Evaluating Scanning Electron Microscopy Images Based on Multi-Scale Characteristics[J]. Laser & Optoelectronics Progress, 2018, 55(11): 111005

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Paper Information

Category: Image Processing

Received: Apr. 16, 2018

Accepted: May. 28, 2018

Published Online: Aug. 14, 2019

The Author Email: Qiaoyue Li (lqy.com.cn@163.com)

DOI:10.3788/LOP55.111005

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology

Table 1. Results of mainstream quality assessment methods and proposed method tested in the SEM database

Table 1. Results of mainstream quality assessment methods and proposed method tested in the SEM database

Table 2. Statistical performance results of compared metrics against the proposed method

Table 2. Statistical performance results of compared metrics against the proposed method