Researching | Subpixel Defect Detection in Highly Reflective Workpieces Based on Zernike Moments

Laser & Optoelectronics Progress, Volume. 56, Issue 12, 121203(2019)

Subpixel Defect Detection in Highly Reflective Workpieces Based on Zernike Moments

Tingting Liu¹, Peiguang Wang^1、*, and Na Zhang²

Author Affiliations

¹ College of Electronic Information Engineering, Hebei University, Baoding, Hebei 0 71002, China

² College of Physical Science and Technology, Hebei University, Baoding, Hebei 0 71002, China

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References(23)

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Tingting Liu, Peiguang Wang, Na Zhang. Subpixel Defect Detection in Highly Reflective Workpieces Based on Zernike Moments[J]. Laser & Optoelectronics Progress, 2019, 56(12): 121203

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Paper Information

Category: Instrumentation, Measurement and Metrology

Received: Nov. 23, 2018

Accepted: Jan. 21, 2019

Published Online: Jun. 13, 2019

The Author Email: Peiguang Wang (pgwang@hbu.edu.cn)

DOI:10.3788/LOP56.121203

Topics

laser devices and laser physics

Lasers and Laser Optics

laser manufacturing

Instrumentation, Measurement and Metrology