Laser & Optoelectronics Progress, Volume. 56, Issue 12, 121203(2019)
Subpixel Defect Detection in Highly Reflective Workpieces Based on Zernike Moments
Fig. 4. Schematic of image preprocessing algorithm of highly reflective workpiece
Fig. 5. Variation of edge pixels of image. (a) Original image; (b) edge pixels of local gray image; (c) 3D image
Fig. 6. Subpixel edge extraction based on Zernike moment. (a) Original edge position; (b) edge position after rotation; (c) generated template image
Fig. 8. Experimental results. (a) Original images; (b) algorithm in Ref. [21]; (c) algorithm in Ref. [22]; (d) proposed algorithm
Fig. 9. Comparative experimental results under different illumination. (a) Workpiece images under different illumination; (b) results of algorithm in Ref. [21]; (c) results of algorithm in Ref. [22]; (d) results of proposed algorithm
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Tingting Liu, Peiguang Wang, Na Zhang. Subpixel Defect Detection in Highly Reflective Workpieces Based on Zernike Moments[J]. Laser & Optoelectronics Progress, 2019, 56(12): 121203
Category: Instrumentation, Measurement and Metrology
Received: Nov. 23, 2018
Accepted: Jan. 21, 2019
Published Online: Jun. 13, 2019
The Author Email: Peiguang Wang (pgwang@hbu.edu.cn)