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Laser & Optoelectronics Progress, Volume. 56, Issue 12, 121203(2019)

Subpixel Defect Detection in Highly Reflective Workpieces Based on Zernike Moments

Tingting Liu1, Peiguang Wang1、*, and Na Zhang2
Author Affiliations
  • 1 College of Electronic Information Engineering, Hebei University, Baoding, Hebei 0 71002, China
  • 2 College of Physical Science and Technology, Hebei University, Baoding, Hebei 0 71002, China
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    Article index updated: Sep. 11, 2025

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    Tingting Liu, Peiguang Wang, Na Zhang. Subpixel Defect Detection in Highly Reflective Workpieces Based on Zernike Moments[J]. Laser & Optoelectronics Progress, 2019, 56(12): 121203

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Nov. 23, 2018

    Accepted: Jan. 21, 2019

    Published Online: Jun. 13, 2019

    The Author Email: Peiguang Wang (pgwang@hbu.edu.cn)

    DOI:10.3788/LOP56.121203

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology