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Chinese Journal of Lasers, Volume. 51, Issue 17, 1703001(2024)

Characterization of Backscattered Electrons in EBCMOS

Meng Lv1, De Song1、*, Gangcheng Jiao2, Ye Li1, Liankai Wang1, and Weijun Chen1、**
Author Affiliations
  • 1School of Physics, Changchun University of Science and Technology, Changchun 130022, Jilin , China
  • 2Science and Technology on Low-Light-Level Night Vision Laboratory, Xi′an710065, Shaanxi , China
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    Article index updated: Sep. 6, 2025

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    Meng Lv, De Song, Gangcheng Jiao, Ye Li, Liankai Wang, Weijun Chen. Characterization of Backscattered Electrons in EBCMOS[J]. Chinese Journal of Lasers, 2024, 51(17): 1703001

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    Paper Information

    Category: Materials

    Received: Nov. 28, 2023

    Accepted: Feb. 26, 2024

    Published Online: Aug. 30, 2024

    The Author Email: De Song (songde614@163.com), Weijun Chen (chenweijun@cust.edu.cn)

    DOI:10.3788/CJL231449

    CSTR:32183.14.CJL231449

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology