Laser & Optoelectronics Progress, Volume. 60, Issue 19, 1926001(2023)
Modeling and Analysis of Parasitic Capacitance in 4-Transistor Pixels Based on Self-Alignment Technique
Fig. 3. Schematic representations of the change in FD node with increasing injection dose. (a) Low injection dose; (b) increased injection dose; (c) large injection dose
Fig. 6. Variation of the electrostatic potential at the boundary of transfer gate with the injection dose
Fig. 7. Optimization of the potential under the sidewall by the tilt injection. (a) Only one vertical injection performed at the FD node; (b) "vertical + tilt" injection performed at the FD node
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Yajuan Du, Jing Gao, Zhiyuan Gao, Kaiming Nie. Modeling and Analysis of Parasitic Capacitance in 4-Transistor Pixels Based on Self-Alignment Technique[J]. Laser & Optoelectronics Progress, 2023, 60(19): 1926001
Category: Physical Optics
Received: Apr. 11, 2022
Accepted: Jun. 13, 2022
Published Online: Sep. 28, 2023
The Author Email: Jing Gao (gaojing@tju.edu.cn)