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Laser & Optoelectronics Progress, Volume. 60, Issue 19, 1926001(2023)

Modeling and Analysis of Parasitic Capacitance in 4-Transistor Pixels Based on Self-Alignment Technique

Yajuan Du1,2, Jing Gao1,2、*, Zhiyuan Gao1,2, and Kaiming Nie1,2
Author Affiliations
  • 1School of Microelectronics, Tianjin University, Tianjin 300072, China
  • 2Tianjin Key Laboratory of Imaging and Sensing Microelectronic Technology, Tianjin 300072, China
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    Article index updated: Sep. 7, 2025

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    Yajuan Du, Jing Gao, Zhiyuan Gao, Kaiming Nie. Modeling and Analysis of Parasitic Capacitance in 4-Transistor Pixels Based on Self-Alignment Technique[J]. Laser & Optoelectronics Progress, 2023, 60(19): 1926001

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    Paper Information

    Category: Physical Optics

    Received: Apr. 11, 2022

    Accepted: Jun. 13, 2022

    Published Online: Sep. 28, 2023

    The Author Email: Jing Gao (gaojing@tju.edu.cn)

    DOI:10.3788/LOP221253

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology