Interface characterization of Mo/Si multilayers

Chinese Optics Letters, Volume. 14, Issue 8, 083401(2016)

Jiaoling Zhao^1,2, Hongbo He^1、*, Hu Wang^1,2, Kui Yi¹, Bin Wang^1,2, and Yun Cui¹

Author Affiliations

¹Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China

²University of Chinese Academy of Sciences, Beijing 100049, China

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Jiaoling Zhao, Hongbo He, Hu Wang, Kui Yi, Bin Wang, Yun Cui, "Interface characterization of Mo/Si multilayers," Chin. Opt. Lett. 14, 083401 (2016)

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Paper Information

Category: X-ray Optics

Received: Mar. 2, 2016

Accepted: May. 24, 2016

Published Online: Aug. 3, 2018

The Author Email: Hongbo He (hbhe@siom.ac.cn)

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