Acta Optica Sinica, Volume. 44, Issue 14, 1412002(2024)
Characterization of Thin Film Parameters Based on Polarization Properties of Vector Beams
[8] Zhao Y, Zhao L H, Zeng A J et al. Mueller matrix model in ellipsometry measurement of quartz crystal[J]. Chinese Journal of Lasers, 50, 1404006(2023).
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Jinhua Li, Zhaolou Cao, Gaige Zheng. Characterization of Thin Film Parameters Based on Polarization Properties of Vector Beams[J]. Acta Optica Sinica, 2024, 44(14): 1412002
Category: Instrumentation, Measurement and Metrology
Received: Jan. 29, 2024
Accepted: Mar. 28, 2024
Published Online: Jul. 4, 2024
The Author Email: Zhaolou Cao (zhaolou.cao@gmail.com)
CSTR:32393.14.AOS240583