Acta Optica Sinica, Volume. 44, Issue 14, 1412002(2024)

Characterization of Thin Film Parameters Based on Polarization Properties of Vector Beams

Jinhua Li1,2,3, Zhaolou Cao1,2,3、*, and Gaige Zheng1,2,3
Author Affiliations
  • 1International Joint Laboratory on Photonics and Optoelectronic Detection for Meteorology, School of Physics and Optoelectronic Engineering, Nanjing University of Information Science & Technology, Nanjing 210044, Jiangsu , China
  • 2Jiangsu Key Laboratory for Optoelectronic Detection of Atmosphere and Ocean, School of Physics and Optoelectronic Engineering, Nanjing University of Information Science & Technology, Nanjing 210044, Jiangsu , China
  • 3School of Physics and Optoelectronic Engineering, Nanjing University of Information Science & Technology, Nanjing 210044, Jiangsu , China
  • show less
    References(23)

    [8] Zhao Y, Zhao L H, Zeng A J et al. Mueller matrix model in ellipsometry measurement of quartz crystal[J]. Chinese Journal of Lasers, 50, 1404006(2023).

    Tools

    Get Citation

    Copy Citation Text

    Jinhua Li, Zhaolou Cao, Gaige Zheng. Characterization of Thin Film Parameters Based on Polarization Properties of Vector Beams[J]. Acta Optica Sinica, 2024, 44(14): 1412002

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Jan. 29, 2024

    Accepted: Mar. 28, 2024

    Published Online: Jul. 4, 2024

    The Author Email: Zhaolou Cao (zhaolou.cao@gmail.com)

    DOI:10.3788/AOS240583

    CSTR:32393.14.AOS240583

    Topics