Acta Optica Sinica, Volume. 44, Issue 14, 1412002(2024)

Characterization of Thin Film Parameters Based on Polarization Properties of Vector Beams

Jinhua Li1,2,3, Zhaolou Cao1,2,3、*, and Gaige Zheng1,2,3
Author Affiliations
  • 1International Joint Laboratory on Photonics and Optoelectronic Detection for Meteorology, School of Physics and Optoelectronic Engineering, Nanjing University of Information Science & Technology, Nanjing 210044, Jiangsu , China
  • 2Jiangsu Key Laboratory for Optoelectronic Detection of Atmosphere and Ocean, School of Physics and Optoelectronic Engineering, Nanjing University of Information Science & Technology, Nanjing 210044, Jiangsu , China
  • 3School of Physics and Optoelectronic Engineering, Nanjing University of Information Science & Technology, Nanjing 210044, Jiangsu , China
  • show less
    Cited By

    Article index updated: Sep. 6, 2025

    The article is cited by 1 article(s) CLP online library. (Some content might be in Chinese.)
    Tools

    Get Citation

    Copy Citation Text

    Jinhua Li, Zhaolou Cao, Gaige Zheng. Characterization of Thin Film Parameters Based on Polarization Properties of Vector Beams[J]. Acta Optica Sinica, 2024, 44(14): 1412002

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Jan. 29, 2024

    Accepted: Mar. 28, 2024

    Published Online: Jul. 4, 2024

    The Author Email: Zhaolou Cao (zhaolou.cao@gmail.com)

    DOI:10.3788/AOS240583

    CSTR:32393.14.AOS240583

    Topics