Characterization of Thin Film Parameters Based on Polarization Properties of Vector Beams

Jinhua Li; Zhaolou Cao; Gaige Zheng

doi:10.3788/AOS240583

Acta Optica Sinica, Volume. 44, Issue 14, 1412002(2024)

Characterization of Thin Film Parameters Based on Polarization Properties of Vector Beams

Jinhua Li^1,2,3, Zhaolou Cao^1,2,3、*, and Gaige Zheng^1,2,3

¹International Joint Laboratory on Photonics and Optoelectronic Detection for Meteorology, School of Physics and Optoelectronic Engineering, Nanjing University of Information Science & Technology, Nanjing 210044, Jiangsu , China

²Jiangsu Key Laboratory for Optoelectronic Detection of Atmosphere and Ocean, School of Physics and Optoelectronic Engineering, Nanjing University of Information Science & Technology, Nanjing 210044, Jiangsu , China

³School of Physics and Optoelectronic Engineering, Nanjing University of Information Science & Technology, Nanjing 210044, Jiangsu , China

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Jinhua Li, Zhaolou Cao, Gaige Zheng. Characterization of Thin Film Parameters Based on Polarization Properties of Vector Beams[J]. Acta Optica Sinica, 2024, 44(14): 1412002

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Paper Information

Category: Instrumentation, Measurement and Metrology

Received: Jan. 29, 2024

Accepted: Mar. 28, 2024

Published Online: Jul. 4, 2024

The Author Email: Zhaolou Cao (zhaolou.cao@gmail.com)

DOI:10.3788/AOS240583

CSTR:32393.14.AOS240583

Topics

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Instrumentation, Measurement and Metrology