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Photonics Research, Volume. 12, Issue 4, 740(2024)

Faster structured illumination microscopy using complementary encoding-based compressive imaging

Zhengqi Huang1, Yunhua Yao1,5、*, Yilin He1, Yu He1, Chengzhi Jin1, Mengdi Guo1, Dalong Qi1, Lianzhong Deng1, Zhenrong Sun1, Zhiyong Wang2,6、*, and Shian Zhang1,3,4,7、*
Author Affiliations
  • 1State Key Laboratory of Precision Spectroscopy, School of Physics and Electronic Science, East China Normal University, Shanghai 200241, China
  • 2School of Mathematical Sciences, University of Electronic Science and Technology of China, Chengdu 611731, China
  • 3Joint Research Center of Light Manipulation Science and Photonic Integrated Chip of East China Normal University and Shandong Normal University, East China Normal University, Shanghai 200241, China
  • 4Collaborative Innovation Center of Extreme Optics, Shanxi University, Taiyuan 030006, China
  • 5e-mail: yhyao@lps.ecnu.edu.cn
  • 6e-mail: zhywang@uestc.edu.cn
  • 7e-mail: sazhang@phy.ecnu.edu.cn
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    Zhengqi Huang, Yunhua Yao, Yilin He, Yu He, Chengzhi Jin, Mengdi Guo, Dalong Qi, Lianzhong Deng, Zhenrong Sun, Zhiyong Wang, Shian Zhang, "Faster structured illumination microscopy using complementary encoding-based compressive imaging," Photonics Res. 12, 740 (2024)

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    Paper Information

    Category: Imaging Systems, Microscopy, and Displays

    Received: Dec. 13, 2023

    Accepted: Jan. 30, 2024

    Published Online: Mar. 22, 2024

    The Author Email: Yunhua Yao (yhyao@lps.ecnu.edu.cn), Zhiyong Wang (zhywang@uestc.edu.cn), Shian Zhang (sazhang@phy.ecnu.edu.cn)

    DOI:10.1364/PRJ.515895

    CSTR:32188.14.PRJ.515895

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology