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Acta Optica Sinica, Volume. 44, Issue 15, 1513018(2024)

Ultralow-Loss Silicon Nitride Integrated Photonics: Nonlinear Optics and Applications (Invited)

Huamin Zheng1, Kunpeng Yu1,2, Shichang Li1,3, Ruiyang Chen1,3, Jiaxuan Wang1,3, Zhiyang Chen1,3, Baoqi Shi1, Zhongkai Wang1, Yi-Han Luo1, Jinbao Long1, Wei Sun1, Wei Liang4, Chengying Bao5, Hairun Guo6, and Junqiu Liu1,2、*
Author Affiliations
  • 1International Quantum Academy, Shenzhen 518048, Guangdong , China
  • 2Hefei National Laboratory, Hefei 230088, Anhui , China
  • 3Institute for Quantum Science and Engineering,Southern University of Science and Technology, Shenzhen 518055, Guangdong , China
  • 4Suzhou Institute of Nano-tech and Nano-bionics, Chinese Academy of Sciences, Suzhou 215123, Jiangsu , China
  • 5Tsinghua University, Beijing 100084, China
  • 6Shanghai University, Shanghai 200444, China
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    Article index updated: Sep. 10, 2025

    The article is cited by 3 article(s) CLP online library. (Some content might be in Chinese.)
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    Huamin Zheng, Kunpeng Yu, Shichang Li, Ruiyang Chen, Jiaxuan Wang, Zhiyang Chen, Baoqi Shi, Zhongkai Wang, Yi-Han Luo, Jinbao Long, Wei Sun, Wei Liang, Chengying Bao, Hairun Guo, Junqiu Liu. Ultralow-Loss Silicon Nitride Integrated Photonics: Nonlinear Optics and Applications (Invited)[J]. Acta Optica Sinica, 2024, 44(15): 1513018

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    Paper Information

    Category: Integrated Optics

    Received: Jun. 17, 2024

    Accepted: Jul. 18, 2024

    Published Online: Aug. 5, 2024

    The Author Email: Junqiu Liu (liujq@iqasz.cn)

    DOI:10.3788/AOS241178

    CSTR:32393.14.AOS241178

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology