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Chinese Optics Letters, Volume. 14, Issue 8, 081202(2016)

Measurement of small wavelength shifts based on total internal reflection heterodyne interferometry

Meng-Chang Hsieh1、*, Jiun-You Lin2, and Chia-Ou Chang1,3
Author Affiliations
  • 1Institute of Applied Mechanics, National Taiwan University, Taipei 10617, China
  • 2Department of Mechatronics Engineering, National Changhua University of Education, Changhua 500, China
  • 3College of Mechanical Engineering, Guangxi University, Nanning 530004, China
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    Cited By

    [1] Meng-Chang Hsieh, Jiun-You Lin, Chia-Ou Chang.

    [1] Meng-Chang Hsieh, Jiun-You Lin, Chia-Ou Chang.

    [1] Meng-Chang Hsieh, Jiun-You Lin, Chia-Ou Chang.

    [1] Meng-Chang Hsieh, Jiun-You Lin, Chia-Ou Chang.

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    Meng-Chang Hsieh, Jiun-You Lin, Chia-Ou Chang, "Measurement of small wavelength shifts based on total internal reflection heterodyne interferometry," Chin. Opt. Lett. 14, 081202 (2016)

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    Paper Information

    Category: Instrumentation, measurement, and metrology

    Received: Jan. 12, 2016

    Accepted: Jun. 14, 2016

    Published Online: Aug. 3, 2018

    The Author Email: Meng-Chang Hsieh (jang1985@msn.com)

    DOI:10.3788/COL201614.081202

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology