Journals Articles Conferences News About CLP
Submit a paper Email Alert
Search
Search
Articles
Journals
News
Advanced Search
Top Searches
2D MaterialsTransformation opticsQuantum PhotonicsSmall lasersSemiconductor UV PhotonicsSupersymmetric microring laser arrays

Chinese Optics Letters, Volume. 14, Issue 8, 081202(2016)

Measurement of small wavelength shifts based on total internal reflection heterodyne interferometry

Meng-Chang Hsieh1、*, Jiun-You Lin2, and Chia-Ou Chang1,3
Author Affiliations
  • 1Institute of Applied Mechanics, National Taiwan University, Taipei 10617, China
  • 2Department of Mechatronics Engineering, National Changhua University of Education, Changhua 500, China
  • 3College of Mechanical Engineering, Guangxi University, Nanning 530004, China
    • show less
    Full TextGet PDF
    Figures&Tables (6)
    Equations (10)
    References (20)
    Cited By (1)
    Tools
    Paper Information
    Topics
    Cited By

    Article index updated: Feb. 24, 2023

    Citation counts are provided from Web of Science. The counts may vary by service, and are reliant on the availability of their data.
    The article is cited by 1 article(s) from Web of Science.
    Tools

    Get Citation

    Copy Citation Text

    Meng-Chang Hsieh, Jiun-You Lin, Chia-Ou Chang, "Measurement of small wavelength shifts based on total internal reflection heterodyne interferometry," Chin. Opt. Lett. 14, 081202 (2016)

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Set citation alerts for article
    Save article for my favorites
    Paper Information

    Category: Instrumentation, measurement, and metrology

    Received: Jan. 12, 2016

    Accepted: Jun. 14, 2016

    Published Online: Aug. 3, 2018

    The Author Email: Meng-Chang Hsieh (jang1985@msn.com)

    DOI:10.3788/COL201614.081202

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology