Acta Optica Sinica, Volume. 38, Issue 6, 0624001(2018)

Single Nanoparticle Label-Free Imaging Based on Evanescent Wave In-Plane Scattering

Liwen Jiang1,2, Xuqing Sun1, Hongyao Liu1, Yaqin Chen1, Wei Xiong1, Chaoqian Zhang1, and Xinchao Lu1,3、*
Author Affiliations
  • 1 Microelectronic Instrument and Equipment Center, Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029, China
  • 2 University of Chinese Academy of Sciences, Beijing 100049, China
  • 3 Beijing Key Laboratory of IC Test Technology, Beijing 100088, China
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    Liwen Jiang, Xuqing Sun, Hongyao Liu, Yaqin Chen, Wei Xiong, Chaoqian Zhang, Xinchao Lu. Single Nanoparticle Label-Free Imaging Based on Evanescent Wave In-Plane Scattering[J]. Acta Optica Sinica, 2018, 38(6): 0624001

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    Paper Information

    Category: Optics at Surfaces

    Received: Nov. 14, 2017

    Accepted: --

    Published Online: Jul. 9, 2018

    The Author Email: Lu Xinchao (luxinchao@ime.ac.cn)

    DOI:10.3788/AOS201838.0624001

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