Single Nanoparticle Label-Free Imaging Based on Evanescent Wave In-Plane Scattering

Liwen Jiang; Xuqing Sun; Hongyao Liu; Yaqin Chen; Wei Xiong; Chaoqian Zhang; Xinchao Lu

doi:10.3788/AOS201838.0624001

Acta Optica Sinica, Volume. 38, Issue 6, 0624001(2018)

Single Nanoparticle Label-Free Imaging Based on Evanescent Wave In-Plane Scattering

Liwen Jiang^1,2, Xuqing Sun¹, Hongyao Liu¹, Yaqin Chen¹, Wei Xiong¹, Chaoqian Zhang¹, and Xinchao Lu^1,3、*

¹ Microelectronic Instrument and Equipment Center, Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029, China

² University of Chinese Academy of Sciences, Beijing 100049, China

³ Beijing Key Laboratory of IC Test Technology, Beijing 100088, China

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Liwen Jiang, Xuqing Sun, Hongyao Liu, Yaqin Chen, Wei Xiong, Chaoqian Zhang, Xinchao Lu. Single Nanoparticle Label-Free Imaging Based on Evanescent Wave In-Plane Scattering[J]. Acta Optica Sinica, 2018, 38(6): 0624001

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Paper Information

Category: Optics at Surfaces

Received: Nov. 14, 2017

Accepted: --

Published Online: Jul. 9, 2018

The Author Email: Lu Xinchao (luxinchao@ime.ac.cn)

DOI:10.3788/AOS201838.0624001

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology