Acta Optica Sinica, Volume. 38, Issue 6, 0624001(2018)

Single Nanoparticle Label-Free Imaging Based on Evanescent Wave In-Plane Scattering

Liwen Jiang1,2, Xuqing Sun1, Hongyao Liu1, Yaqin Chen1, Wei Xiong1, Chaoqian Zhang1, and Xinchao Lu1,3、*
Author Affiliations
  • 1 Microelectronic Instrument and Equipment Center, Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029, China
  • 2 University of Chinese Academy of Sciences, Beijing 100049, China
  • 3 Beijing Key Laboratory of IC Test Technology, Beijing 100088, China
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    Figures & Tables(5)
    (a) SEM image of 200 nm polystyrene nanoparticle distribution; (b) SEM image of single nanoparticle
    (a) Schematic of imaging setup based on TIR evanescent wave excitation; (b) schematic of imaging setup based on SPPs excitation; (c) variation of TIR reflectance with incident angle; (d) variation of SPPs reflectance with incident angle
    Imaging of single polystyrene nanoparticle with the diameter of (a) 500 nm, (b) 200 nm and (c) 100 nm based on TIR evanescent wave; imaging of single polystyrene nanoparticle with the diameter of (d) 500 nm, (e) 200 nm and (f) 100 nm based on SPPs
    Spatial distribution simulation of |E→|2. (a) TIR; (b) SPPs
    Comparison of the polarization intensity of single polystyrene nanoparticle with TIR evanescent wave and SPPs
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    Liwen Jiang, Xuqing Sun, Hongyao Liu, Yaqin Chen, Wei Xiong, Chaoqian Zhang, Xinchao Lu. Single Nanoparticle Label-Free Imaging Based on Evanescent Wave In-Plane Scattering[J]. Acta Optica Sinica, 2018, 38(6): 0624001

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    Paper Information

    Category: Optics at Surfaces

    Received: Nov. 14, 2017

    Accepted: --

    Published Online: Jul. 9, 2018

    The Author Email: Lu Xinchao (luxinchao@ime.ac.cn)

    DOI:10.3788/AOS201838.0624001

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