Fig. 1. Analysis of fluorescence crosstalk

Fig. 2. Scintillation screen with double-layer structure

Fig. 3. Simulation models of fluorescence detection. (a) simulation model of single-layer scintillation screen; (b) simulation model of double-layer scintillation screen

Fig. 4. Simulation results of spatial resolution of detector. (a) X-ray incident plane of scintillation screen is reflective layer; (b) X-ray incident plane of scintillation screen is light-absorbing layer; (c) X-ray incident plane of scintillation screen is polishing only

Fig. 5. Influence of coupling medium thickness on spatial resolution of detector

Fig. 6. X-ray imaging test platform

Fig. 7. Test components and detector. (a) scintillation screen with thickness of 200 μm; (b) scintillation screen with thickness of 100 μm; (c) scintillation screen with thickness of 100 μm; (d) detector made of scintillation screen in Fig. 7(a); (e) detector made of scintillation screens in Fig. 7(b) and Fig. 7 (c); (f) duplex wire image quality indicator

Fig. 8. Imaging test results of duplex wire image quality indicator. (a) DR image measured by scintillation screen with double-layer structure; (b) gray value comparison curves of D13 wire pair; (c) DR image measured by single-layer scintillation screen; (d) gray value comparison curves of D15 wire pair

Fig. 9. MTF curves of detector using scintillation screen with double-layer structure and single-layer scintillation screen