High-Resolution Scintillation Screen with Double-Layer Structure Based on Crosstalk Suppression by Interface Total Reflection

Kang An; Wenfang Li; Xiaojiao Duan; Yu Du; Rifeng Zhou; Jue Wang

doi:10.3788/AOS202242.2211004

Acta Optica Sinica, Volume. 42, Issue 22, 2211004(2022)

High-Resolution Scintillation Screen with Double-Layer Structure Based on Crosstalk Suppression by Interface Total Reflection

Kang An^1,2, Wenfang Li^1,2, Xiaojiao Duan^1,2, Yu Du³, Rifeng Zhou^1,2, and Jue Wang^1,2、*

Author Affiliations

¹Key Laboratory of Optoelectronic Technology & Systems, Ministry of Education, College of Optoelectronic Engineering, Chongqing University, Chongqing 400044, China

²Industrial CT Non-destructive Testing Engineering Research Center of Ministry of Education, Chongqing 400044, China

³Institute of Chemical Materials, China Academy of Engineering Physics, Mianyang 621000, Sichuan , China

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Kang An, Wenfang Li, Xiaojiao Duan, Yu Du, Rifeng Zhou, Jue Wang. High-Resolution Scintillation Screen with Double-Layer Structure Based on Crosstalk Suppression by Interface Total Reflection[J]. Acta Optica Sinica, 2022, 42(22): 2211004

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Paper Information

Category: Imaging Systems

Received: Mar. 15, 2022

Accepted: May. 30, 2022

Published Online: Nov. 7, 2022

The Author Email: Wang Jue (wangjue@cqu.edu.cn)

DOI:10.3788/AOS202242.2211004

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